Electronic components and processes

Electronic devices : a text and software problems manual /
由: Schultz, Mitchel E.
出版: (1994)

Hertzian tales electronic products, aesthetic experience, and critical design /
由: Dunne, Anthony
出版: (2005)

Parts selection and management
出版: (2004)

Failure analysis a practical guide for manufacturers of electronic components and systems /
由: Bâzu, M. I. (Marius I.), 1948-
出版: (2011)

Reliability technology principles and practice of failure prevention in electronic systems /
由: Pascoe, Norman
出版: (2011)

Designing the internet of things /
由: McEwen, Adrian
出版: (2014)

High temperature electronics design for aero engine controls and health monitoring /
由: Stoica, Lucian, et al.
出版: (2016)

Boundary-scan interconnect diagnosis
由: Sousa, José T. de
出版: (2001)

Electronic : devices and circuits /
由: Kulshreshtha, D. c.
出版: (2006)

Solid state electronic devices /
由: Streetman, Ben G.
出版: (2010)

Electronic materials science
由: Irene, Eugene A.
出版: (2005)

Polymers for electricity and electronics materials, properties, and applications /
由: Drobny, Jiri George
出版: (2012)

Digital rubbish natural history of electronics /
由: Gabrys, Jennifer
出版: (2011)

Microwave component mechanics
由: Eskelinen, Harri
出版: (2003)

A designer's guide to built-in self-test
由: Stroud, Charles E.
出版: (2002)

Electrical characterization of organic electronic materials and devices
由: Stallinga, Peter, 1966-
出版: (2009)

High tech trash digital devices, hidden toxics, and human health /
由: Grossman, Elizabeth, 1957-
出版: (2006)

Single-electron devices and circuits in silicon
由: Durrani, Zahid Ali Khan
出版: (2010)

ESD basics from semiconductor manufacturing to use /
由: Voldman, Steven H.
出版: (2012)

Introduction to microfabrication
由: Franssila, Sami
出版: (2010)

Components, packaging and manufacturing technology II : selected, peer reviewed papers from the 2013 3rd International Conference on Packaging and Manufacturing Technology (ICCPMT 2013), December 31, 2013 - January 2, 2014, Brisbane Australia /
出版: (2014)

Advanced manufacturing process, lead free interconnect materials and reliability modeling for electronics packaging
出版: (2006)

Cost analysis of electronic systems
由: Sandborn, Peter
出版: (2013)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
出版: (2008)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
出版: (2000)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
出版: (2001)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
出版: (2011)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
出版: (2007)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
出版: (2004)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
出版: (1998)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
出版: (2009)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
出版: (2002)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
出版: (1999)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
出版: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
出版: (1997)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
出版: (2003)