Electronic components and processes
-д хадгалсан:
Үндсэн зохиолч: | Maheshwari, Preeti |
---|---|
Байгууллагын зохиогч: | ebrary, Inc |
Формат: | Цахим Цахим ном |
Хэл сонгох: | англи |
Хэвлэсэн: |
New Delhi :
New Age International,
c2006.
|
Нөхцлүүд: | |
Онлайн хандалт: | An electronic book accessible through the World Wide Web; click to view |
Шошгууд: |
Шошго нэмэх
Шошго байхгүй, Энэхүү баримтыг шошголох эхний хүн болох!
|
Ижил төстэй зүйлс
Polymers for electronic components a Rapra industry analysis report /
-н: Cousins, Keith
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-н: Cousins, Keith
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Guide to state-of-the-art electron devices
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Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
-н: Karris, Steven T.
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-н: Karris, Steven T.
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Novel architectures for flexible electrochemical devices and systems
-н: Kawahara, Jun
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-н: Kawahara, Jun
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Electronic devices : a text and software problems manual /
-н: Schultz, Mitchel E.
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-н: Schultz, Mitchel E.
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High tech trash digital devices, hidden toxics, and human health /
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ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
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ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
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ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
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ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
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ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Хэвлэсэн: (2007)
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ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
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ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
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ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
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ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
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ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
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ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
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ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
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ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
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Ижил төстэй зүйлс
-
Polymers for electronic components a Rapra industry analysis report /
-н: Cousins, Keith
Хэвлэсэн: (2001) -
Guide to state-of-the-art electron devices
Хэвлэсэн: (2013) -
Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
-н: Karris, Steven T.
Хэвлэсэн: (2012) -
Novel architectures for flexible electrochemical devices and systems
-н: Kawahara, Jun
Хэвлэсэн: (2013) -
Electronic devices : a text and software problems manual /
-н: Schultz, Mitchel E.
Хэвлэсэн: (1994)