Electrical characterization of organic electronic materials and devices
Guardat en:
Autor principal: | Stallinga, Peter, 1966- |
---|---|
Autor corporatiu: | ebrary, Inc |
Format: | Electrònic eBook |
Idioma: | anglès |
Publicat: |
Hoboken, NJ :
John Wiley & Sons,
2009.
|
Matèries: | |
Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
Etiquetes: |
Afegir etiqueta
Sense etiquetes, Sigues el primer a etiquetar aquest registre!
|
Ítems similars
Electronic materials science
per: Irene, Eugene A.
Publicat: (2005)
per: Irene, Eugene A.
Publicat: (2005)
Polymers for electricity and electronics materials, properties, and applications /
per: Drobny, Jiri George
Publicat: (2012)
per: Drobny, Jiri George
Publicat: (2012)
Solid state electronic devices /
per: Streetman, Ben G.
Publicat: (2010)
per: Streetman, Ben G.
Publicat: (2010)
Single-electron devices and circuits in silicon
per: Durrani, Zahid Ali Khan
Publicat: (2010)
per: Durrani, Zahid Ali Khan
Publicat: (2010)
ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Publicat: (2015)
Publicat: (2015)
ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Publicat: (2009)
Publicat: (2009)
ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Publicat: (2010)
Publicat: (2010)
ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Publicat: (2001)
Publicat: (2001)
ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Publicat: (2004)
Publicat: (2004)
ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Publicat: (2003)
Publicat: (2003)
ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Publicat: (1996)
Publicat: (1996)
ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Publicat: (2008)
Publicat: (2008)
ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Publicat: (2005)
Publicat: (2005)
ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Publicat: (1997)
Publicat: (1997)
ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Publicat: (1998)
Publicat: (1998)
ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Publicat: (2011)
Publicat: (2011)
ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Publicat: (2002)
Publicat: (2002)
ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Publicat: (2007)
Publicat: (2007)
ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Publicat: (1999)
Publicat: (1999)
ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Publicat: (2014)
Publicat: (2014)
ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Publicat: (2013)
Publicat: (2013)
ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Publicat: (2006)
Publicat: (2006)
Organic electronics emerging concepts and technologies /
Publicat: (2013)
Publicat: (2013)
Guide to state-of-the-art electron devices
Publicat: (2013)
Publicat: (2013)
Electronic : devices and circuits /
per: Kulshreshtha, D. c.
Publicat: (2006)
per: Kulshreshtha, D. c.
Publicat: (2006)
An essential guide to electronic material surfaces and interfaces /
per: Brillson, L. J.
Publicat: (2016)
per: Brillson, L. J.
Publicat: (2016)
Electronic components and processes
per: Maheshwari, Preeti
Publicat: (2006)
per: Maheshwari, Preeti
Publicat: (2006)
Polymers for electronic components a Rapra industry analysis report /
per: Cousins, Keith
Publicat: (2001)
per: Cousins, Keith
Publicat: (2001)
Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
per: Karris, Steven T.
Publicat: (2012)
per: Karris, Steven T.
Publicat: (2012)
Electronic devices : a text and software problems manual /
per: Schultz, Mitchel E.
Publicat: (1994)
per: Schultz, Mitchel E.
Publicat: (1994)
Electronic materials /
per: Kwok, H. L.
Publicat: (2010)
per: Kwok, H. L.
Publicat: (2010)
Novel architectures for flexible electrochemical devices and systems
per: Kawahara, Jun
Publicat: (2013)
per: Kawahara, Jun
Publicat: (2013)
Microelectronic failure analysis desk reference : 2001 supplement /
Publicat: (2001)
Publicat: (2001)
Microelectronic failure analysis desk reference.
Publicat: (2002)
Publicat: (2002)
Microelectronics failure analysis desk reference /
Publicat: (2011)
Publicat: (2011)
Advances in electronic materials : special topic volume with invited papers only /
Publicat: (2009)
Publicat: (2009)
ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Publicat: (2000)
Publicat: (2000)
ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Publicat: (2012)
Publicat: (2012)
HeteroSiC & WASMPE 2011 : selected, peer reviewed papers from the 4th Workshop on Advanced Semiconductor Materials and Devices for Power Electronics Applications (HeteroSiC & WASMPE 2011), June 27-30, 2011, Tours, France /
Publicat: (2012)
Publicat: (2012)
New organic semiconductors for applications in organic electronics
per: Du, Chunyan
Publicat: (2010)
per: Du, Chunyan
Publicat: (2010)
Ítems similars
-
Electronic materials science
per: Irene, Eugene A.
Publicat: (2005) -
Polymers for electricity and electronics materials, properties, and applications /
per: Drobny, Jiri George
Publicat: (2012) -
Solid state electronic devices /
per: Streetman, Ben G.
Publicat: (2010) -
Single-electron devices and circuits in silicon
per: Durrani, Zahid Ali Khan
Publicat: (2010) -
ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Publicat: (2015)