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Transient-induced latchup in CMOS integrated circuits

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Bibliografske podrobnosti
Glavni avtor:	Ker, Ming-Dou
Korporativna značnica:	ebrary, Inc
Drugi avtorji:	Hsu, Sheng-Fu
Format:	Elektronski eKnjiga
Jezik:	angleščina
Izdano:	Singapore ; Hoboken, NJ : Wiley, c2009.
Teme:	Metal oxide semiconductors, Complementary > Defects. Metal oxide semiconductors, Complementary > Reliability. Electronic books.
Online dostop:	An electronic book accessible through the World Wide Web; click to view
Oznake:	Označite Brez oznak, prvi označite!

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