ebrary, Inc, Schrimpf, R. D., & Fleetwood, D. M. (2004). Radiation effects and soft errors in integrated circuits and electronic devices. World Scientific Pub..
芝加哥风格引文ebrary, Inc, Ronald Donald Schrimpf, 与 D. M. Fleetwood. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Singapore ; New Jersey: World Scientific Pub., 2004.
MLA引文ebrary, Inc, et al. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. World Scientific Pub., 2004.
警告：这些引文格式不一定是100％准确.