ebrary, Inc, Schrimpf, R. D., & Fleetwood, D. M. (2004). Radiation effects and soft errors in integrated circuits and electronic devices. World Scientific Pub..
Chicago Style (17th ed.) Citationebrary, Inc, Ronald Donald Schrimpf, and D. M. Fleetwood. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Singapore ; New Jersey: World Scientific Pub., 2004.
MLA引文ebrary, Inc, et al. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. World Scientific Pub., 2004.
警告:這些引文格式不一定是100%准確.