ebrary, Inc, Schrimpf, R. D., & Fleetwood, D. M. (2004). Radiation effects and soft errors in integrated circuits and electronic devices. World Scientific Pub..
Цитирование в стиле Чикаго (17-е изд.)ebrary, Inc, Ronald Donald Schrimpf, и D. M. Fleetwood. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Singapore ; New Jersey: World Scientific Pub., 2004.
Цитирование MLA (9-е изд.)ebrary, Inc, et al. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. World Scientific Pub., 2004.
Предупреждение: эти цитированмия не могут быть всегда правильны на 100%.