ebrary, Inc, Schrimpf, R. D., & Fleetwood, D. M. (2004). Radiation effects and soft errors in integrated circuits and electronic devices. World Scientific Pub..
Citación estilo Chicagoebrary, Inc, Ronald Donald Schrimpf, and D. M. Fleetwood. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Singapore ; New Jersey: World Scientific Pub., 2004.
Cita MLAebrary, Inc, et al. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. World Scientific Pub., 2004.
Warning: These citations may not always be 100% accurate.