ebrary, Inc, Schrimpf, R. D., & Fleetwood, D. M. (2004). Radiation effects and soft errors in integrated circuits and electronic devices. World Scientific Pub..
Chicago-viite (17. p.)ebrary, Inc, Ronald Donald Schrimpf, ja D. M. Fleetwood. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. Singapore ; New Jersey: World Scientific Pub., 2004.
MLA-viite (9. p.)ebrary, Inc, et al. Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices. World Scientific Pub., 2004.
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