System-on-chip test architectures nanometer design for testability /
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企业作者: | ebrary, Inc |
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其他作者: | Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A. |
格式: | 电子 电子书 |
语言: | 英语 |
出版: |
Amsterdam ; Boston :
Morgan Kaufmann Publishers,
c2008.
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丛编: | Morgan Kaufmann series in systems on silicon.
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在线阅读: | An electronic book accessible through the World Wide Web; click to view |
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