System-on-chip test architectures nanometer design for testability /
Shranjeno v:
Korporativna značnica: | ebrary, Inc |
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Drugi avtorji: | Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A. |
Format: | Elektronski eKnjiga |
Jezik: | angleščina |
Izdano: |
Amsterdam ; Boston :
Morgan Kaufmann Publishers,
c2008.
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Serija: | Morgan Kaufmann series in systems on silicon.
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Teme: | |
Online dostop: | An electronic book accessible through the World Wide Web; click to view |
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