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System-on-chip test architectures nanometer design for testability /

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Bibliográfalaš dieđut
Searvvušdahkki:	ebrary, Inc
Eará dahkkit:	Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Materiálatiipa:	Elektrovnnalaš E-girji
Giella:	eaŋgalasgiella
Almmustuhtton:	Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Ráidu:	Morgan Kaufmann series in systems on silicon.
Fáttát:	Systems on a chip > Testing. Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Electronic books.
Liŋkkat:	An electronic book accessible through the World Wide Web; click to view
Fáddágilkorat:	Lasit fáddágilkoriid Eai fáddágilkorat, Lasit vuosttaš fáddágilkora!

Geahča maid

System-on-chip test architectures nanometer design for testability /
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VLSI test principles and architectures design for testability /
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VLSI test principles and architectures design for testability /
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Power-constrained testing of VLSI circuits
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Power-constrained testing of VLSI circuits
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Almmustuhtton: (2002)

Design of analog-digital VLSI circuits for telecommunications and ... /
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VLSI circuits for biomedical applications
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VLSI circuits for biomedical applications
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High performance devices proceedings of the 2004 IEEE Lester Eastman Conference on High Performance Devices, Rensselaer Polytechnic Institute, 4-6 August 2004 /
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VLSI custom microelectronics digital, analog, and mixed-signal /
Dahkki: Hurst, S. L. (Stanley Leonard)
Almmustuhtton: (1999)

VLSI custom microelectronics digital, analog, and mixed-signal /
Dahkki: Hurst, S. L. (Stanley Leonard)
Almmustuhtton: (1999)

Mosfet modeling for VLSI simulation theory and practice /
Dahkki: Arora, N. (Narain), 1943-
Almmustuhtton: (2007)

Mosfet modeling for VLSI simulation theory and practice /
Dahkki: Arora, N. (Narain), 1943-
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Verification by error modeling using testing techniques in hardware verification /
Dahkki: Radecka, Katarzyna
Almmustuhtton: (2003)

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Advanced high speed devices
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CMOS fractional-N synthesizers design for high spectral purity and monolithic integration /
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Electromigration in ULSI interconnections
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Almmustuhtton: (2010)

Electromigration in ULSI interconnections
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Advanced interconnects for ULSI technology
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Advanced interconnects for ULSI technology
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VLSI and computer architecture
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VLSI and computer architecture
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Wafer-level testing and test during burn-in for integrated circuits
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Almmustuhtton: (2010)

Wafer-level testing and test during burn-in for integrated circuits
Dahkki: Bahukudumbi, Sudarshan
Almmustuhtton: (2010)

A one-semester course in modeling of VLSI interconnections /
Dahkki: Goel, Ashok K., 1953-
Almmustuhtton: (2015)

A one-semester course in modeling of VLSI interconnections /
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Almmustuhtton: (2015)

Terrestrial radiation effects in ULSI devices and electronic systems /
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Almmustuhtton: (2015)

Terrestrial radiation effects in ULSI devices and electronic systems /
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System integration from transistor design to large scale integrated circuits /
Dahkki: Hoffmann, Kurt, 1951-
Almmustuhtton: (2004)

System integration from transistor design to large scale integrated circuits /
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An engineer's guide to automated testing of high-speed interfaces
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Almmustuhtton: (2010)