System-on-chip test architectures nanometer design for testability /
Gorde:
Erakunde egilea: | ebrary, Inc |
---|---|
Beste egile batzuk: | Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A. |
Formatua: | Baliabide elektronikoa eBook |
Hizkuntza: | ingelesa |
Argitaratua: |
Amsterdam ; Boston :
Morgan Kaufmann Publishers,
c2008.
|
Saila: | Morgan Kaufmann series in systems on silicon.
|
Gaiak: | |
Sarrera elektronikoa: | An electronic book accessible through the World Wide Web; click to view |
Etiketak: |
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System-on-chip test architectures nanometer design for testability /
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