System-on-chip test architectures nanometer design for testability /
Guardat en:
Autor corporatiu: | ebrary, Inc |
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Altres autors: | Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A. |
Format: | Electrònic eBook |
Idioma: | anglès |
Publicat: |
Amsterdam ; Boston :
Morgan Kaufmann Publishers,
c2008.
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Col·lecció: | Morgan Kaufmann series in systems on silicon.
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Matèries: | |
Accés en línia: | An electronic book accessible through the World Wide Web; click to view |
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