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System-on-chip test architectures nanometer design for testability /

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Sonraí bibleagrafaíochta
Údar corparáideach:	ebrary, Inc
Rannpháirtithe:	Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Formáid:	Leictreonach Ríomhleabhar
Teanga:	Béarla
Foilsithe / Cruthaithe:	Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Sraith:	Morgan Kaufmann series in systems on silicon.
Ábhair:	Systems on a chip > Testing. Integrated circuits > Very large scale integration > Testing. Integrated circuits > Very large scale integration > Design. Electronic books.
Rochtain ar líne:	An electronic book accessible through the World Wide Web; click to view
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

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