System-on-chip test architectures nanometer design for testability /

System-on-chip test architectures nanometer design for testability /

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Bibliographic Details
Corporate Author: ebrary, Inc
Other Authors: Wang, Laung-Terng, Stroud, Charles E., Touba, Nur A.
Format: Electronic eBook
Language:English
Published: Amsterdam ; Boston : Morgan Kaufmann Publishers, c2008.
Series:Morgan Kaufmann series in systems on silicon.
Subjects:
Systems on a chip > Testing.
Integrated circuits > Very large scale integration > Testing.
Integrated circuits > Very large scale integration > Design.
Electronic books.
Online Access:An electronic book accessible through the World Wide Web; click to view
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