System-on-chip test architectures nanometer design for testability /
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Corporate Author: | |
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Other Authors: | , , |
Format: | Electronic eBook |
Language: | English |
Published: |
Amsterdam ; Boston :
Morgan Kaufmann Publishers,
c2008.
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Series: | Morgan Kaufmann series in systems on silicon.
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Subjects: | |
Online Access: | An electronic book accessible through the World Wide Web; click to view |
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001 | 0000096638 | ||
005 | 20171002054957.0 | ||
006 | m u | ||
007 | cr cn||||||||| | ||
008 | 070604s2008 ne a sb 001 0 eng | ||
010 | |z 2007023373 | ||
020 | |z 9780123739735 (hardcover : alk. paper) | ||
020 | |z 012373973X (hardcover : alk. paper) | ||
035 | |a (CaPaEBR)ebr10203465 | ||
035 | |a (OCoLC)228148482 | ||
040 | |a CaPaEBR |c CaPaEBR | ||
050 | 1 | 4 | |a TK7895.E42 |b S978 2008eb |
082 | 0 | 4 | |a 621.39/5 |2 22 |
245 | 0 | 0 | |a System-on-chip test architectures |h [electronic resource] : |b nanometer design for testability / |c edited by Laung-Terng Wang, Charles E. Stroud, Nur A. Touba. |
260 | |a Amsterdam ; |a Boston : |b Morgan Kaufmann Publishers, |c c2008. | ||
300 | |a xxxvi, 856 p. : |b ill. | ||
490 | 1 | |a The Morgan Kaufmann series in systems on silicon | |
504 | |a Includes bibliographical references and index. | ||
533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2013. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
650 | 0 | |a Systems on a chip |x Testing. | |
650 | 0 | |a Integrated circuits |x Very large scale integration |x Testing. | |
650 | 0 | |a Integrated circuits |x Very large scale integration |x Design. | |
655 | 7 | |a Electronic books. |2 local | |
700 | 1 | |a Wang, Laung-Terng. | |
700 | 1 | |a Stroud, Charles E. | |
700 | 1 | |a Touba, Nur A. | |
710 | 2 | |a ebrary, Inc. | |
830 | 0 | |a Morgan Kaufmann series in systems on silicon. | |
856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10203465 |z An electronic book accessible through the World Wide Web; click to view |
908 | |a 170314 | ||
942 | 0 | 0 | |c EB |
999 | |c 85792 |d 85792 |