A designer's guide to built-in self-test

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Vydáno: (2002)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Vydáno: (1999)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Vydáno: (2000)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Vydáno: (1998)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Vydáno: (2004)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Vydáno: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Vydáno: (1997)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Vydáno: (2003)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Vydáno: (2001)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Vydáno: (2012)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Vydáno: (2008)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Vydáno: (2010)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Vydáno: (2011)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Vydáno: (2007)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Vydáno: (2014)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Vydáno: (2013)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Vydáno: (2009)

Designing the internet of things /
Autor: McEwen, Adrian
Vydáno: (2014)

Guide to state-of-the-art electron devices
Vydáno: (2013)

Electronic devices : a text and software problems manual /
Autor: Schultz, Mitchel E.
Vydáno: (1994)

Solid state electronic devices /
Autor: Streetman, Ben G.
Vydáno: (2010)

Novel architectures for flexible electrochemical devices and systems
Autor: Kawahara, Jun
Vydáno: (2013)

ESD basics from semiconductor manufacturing to use /
Autor: Voldman, Steven H.
Vydáno: (2012)

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Vydáno: (2006)

Electronic components and processes
Autor: Maheshwari, Preeti
Vydáno: (2006)

Boundary-scan interconnect diagnosis
Autor: Sousa, José T. de
Vydáno: (2001)

Power sources and supplies world class designs /
Vydáno: (2008)

Microwave component mechanics
Autor: Eskelinen, Harri
Vydáno: (2003)

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Vydáno: (2015)

Electronic : devices and circuits /
Autor: Kulshreshtha, D. c.
Vydáno: (2006)

Failure analysis a practical guide for manufacturers of electronic components and systems /
Autor: Bâzu, M. I. (Marius I.), 1948-
Vydáno: (2011)

Polymers for electricity and electronics materials, properties, and applications /
Autor: Drobny, Jiri George
Vydáno: (2012)

Electronic materials science
Autor: Irene, Eugene A.
Vydáno: (2005)

Electronic devices and amplifier circuits with MATLABʼ / Simulinkʼ / SimElectronics ʼ examples
Autor: Karris, Steven T.
Vydáno: (2012)

Digital rubbish natural history of electronics /
Autor: Gabrys, Jennifer
Vydáno: (2011)

High tech trash digital devices, hidden toxics, and human health /
Autor: Grossman, Elizabeth, 1957-
Vydáno: (2006)