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Design for at-speed test, diagnosis, and measurement

Sábháilte in:

Sonraí bibleagrafaíochta
Údar corparáideach:	ebrary, Inc
Rannpháirtithe:	Nadeau-Dostie, Benoit
Formáid:	Leictreonach Ríomhleabhar
Teanga:	Béarla
Foilsithe / Cruthaithe:	Boston : Kluwer Academic, c2000.
Sraith:	Frontiers in electronic testing.
Ábhair:	Integrated circuits > Testing. Electronic apparatus and appliances > Testing. Electronic books.
Rochtain ar líne:	An electronic book accessible through the World Wide Web; click to view
Clibeanna:	Cuir clib leis Níl clibeanna ann, Bí ar an gcéad duine le clib a chur leis an taifead seo!

Míreanna comhchosúla

Wafer-level testing and test during burn-in for integrated circuits
de réir: Bahukudumbi, Sudarshan
Foilsithe / Cruthaithe: (2010)

A designer's guide to built-in self-test
de réir: Stroud, Charles E.
Foilsithe / Cruthaithe: (2002)

An engineer's guide to automated testing of high-speed interfaces
de réir: Moreira, José, 1975-
Foilsithe / Cruthaithe: (2010)

VLSI test principles and architectures design for testability /
Foilsithe / Cruthaithe: (2006)

Parts selection and management
Foilsithe / Cruthaithe: (2004)

Boundary-scan interconnect diagnosis
de réir: Sousa, José T. de
Foilsithe / Cruthaithe: (2001)

Power-constrained testing of VLSI circuits
de réir: Nicolici, Nicola
Foilsithe / Cruthaithe: (2003)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Foilsithe / Cruthaithe: (1996)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Foilsithe / Cruthaithe: (2000)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Foilsithe / Cruthaithe: (2002)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Foilsithe / Cruthaithe: (1999)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Foilsithe / Cruthaithe: (1998)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Foilsithe / Cruthaithe: (2004)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Foilsithe / Cruthaithe: (2003)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Foilsithe / Cruthaithe: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Foilsithe / Cruthaithe: (1997)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Foilsithe / Cruthaithe: (2001)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Foilsithe / Cruthaithe: (2008)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Foilsithe / Cruthaithe: (2012)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Foilsithe / Cruthaithe: (2011)

ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
Foilsithe / Cruthaithe: (2010)

ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
Foilsithe / Cruthaithe: (2007)

ISTFA 2013 : conference proceedings from the 39th International Symposium for Testing and Failure Analysis, November 3-7, 2013, San Jose Convention Center, San Jose, California, USA /
Foilsithe / Cruthaithe: (2013)

ISTFA 2014 : conference proceedings from the 40th International Symposium for Testing and Failure Analysis ; November 9-13, 2014, George R. Brown Conversion Center, Houston, Texas, USA /
Foilsithe / Cruthaithe: (2014)

ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /
Foilsithe / Cruthaithe: (2009)

CMOS RFIC design principles
de réir: Caverly, Robert
Foilsithe / Cruthaithe: (2007)

Digital circuit analysis and design with simulink modeling
de réir: Karris, Steven T.
Foilsithe / Cruthaithe: (2007)

Electronic : devices and circuits /
de réir: Kulshreshtha, D. c.
Foilsithe / Cruthaithe: (2006)

ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
Foilsithe / Cruthaithe: (2006)

ISTFA 2015 conference proceedings from the 41st International Symposium for Testing and Failure Analysis : November 1-5 2015, Oregon Convention Center, Portland, Oregon, USA /
Foilsithe / Cruthaithe: (2015)

Analog circuit design
Foilsithe / Cruthaithe: (2013)

High-speed integrated circuit technology towards 100 GHz logic /
Foilsithe / Cruthaithe: (2001)

System level ESD co-design /
Foilsithe / Cruthaithe: (2015)

Advanced high speed devices
Foilsithe / Cruthaithe: (2010)

Microelectronic circuit design /
de réir: Jaeger, Richard C.
Foilsithe / Cruthaithe: (2006)

Electronic devices : a text and software problems manual /
de réir: Schultz, Mitchel E.
Foilsithe / Cruthaithe: (1994)

Current sources & voltage references
de réir: Harrison, Linden T.
Foilsithe / Cruthaithe: (2005)

Analog circuits
Foilsithe / Cruthaithe: (2008)

ESD circuits and devices /
de réir: Voldman, Steven H.
Foilsithe / Cruthaithe: (2006)

RF measurements for cellular phones and wireless data systems
de réir: Scott, Allan W.
Foilsithe / Cruthaithe: (2008)