Obálka

QR kód

Design for at-speed test, diagnosis, and measurement

Zobrazit další vydání (1)

Uloženo v:

Podrobná bibliografie
Korporativní autor:	ebrary, Inc
Další autoři:	Nadeau-Dostie, Benoit
Médium:	Elektronický zdroj E-kniha
Jazyk:	angličtina
Vydáno:	Boston : Kluwer Academic, c2000.
Edice:	Frontiers in electronic testing.
Témata:	Integrated circuits > Testing. Electronic apparatus and appliances > Testing. Electronic books.
On-line přístup:	An electronic book accessible through the World Wide Web; click to view
Tagy:	Přidat tag Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!

Podobné jednotky

Design for at-speed test, diagnosis, and measurement
Vydáno: (2000)

Wafer-level testing and test during burn-in for integrated circuits
Autor: Bahukudumbi, Sudarshan
Vydáno: (2010)

Wafer-level testing and test during burn-in for integrated circuits
Autor: Bahukudumbi, Sudarshan
Vydáno: (2010)

A designer's guide to built-in self-test
Autor: Stroud, Charles E.
Vydáno: (2002)

A designer's guide to built-in self-test
Autor: Stroud, Charles E.
Vydáno: (2002)

An engineer's guide to automated testing of high-speed interfaces
Autor: Moreira, José, 1975-
Vydáno: (2010)

An engineer's guide to automated testing of high-speed interfaces
Autor: Moreira, José, 1975-
Vydáno: (2010)

VLSI test principles and architectures design for testability /
Vydáno: (2006)

VLSI test principles and architectures design for testability /
Vydáno: (2006)

Parts selection and management
Vydáno: (2004)

Parts selection and management
Vydáno: (2004)

Boundary-scan interconnect diagnosis
Autor: Sousa, José T. de
Vydáno: (2001)

Boundary-scan interconnect diagnosis
Autor: Sousa, José T. de
Vydáno: (2001)

Power-constrained testing of VLSI circuits
Autor: Nicolici, Nicola
Vydáno: (2003)

Power-constrained testing of VLSI circuits
Autor: Nicolici, Nicola
Vydáno: (2003)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Vydáno: (1996)

ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
Vydáno: (1996)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Vydáno: (2000)

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
Vydáno: (2000)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Vydáno: (1999)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Vydáno: (2002)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Vydáno: (1998)

ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
Vydáno: (1999)

ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
Vydáno: (1998)

ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
Vydáno: (2002)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Vydáno: (2004)

ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
Vydáno: (2004)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Vydáno: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Vydáno: (1997)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Vydáno: (2003)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Vydáno: (2001)

ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /
Vydáno: (2003)

ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /
Vydáno: (2005)

ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /
Vydáno: (1997)

ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
Vydáno: (2001)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Vydáno: (2012)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Vydáno: (2008)

ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
Vydáno: (2012)

ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
Vydáno: (2008)

ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA /
Vydáno: (2011)