Goodhew, P. J., Beanland, R., & Humphreys, F. J. (2001). Electron microscopy and analysis (3rd ed.). Taylor & Francis.
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Chicago Style (17th ed.) Citation
Goodhew, Peter J., R. Beanland, and F. J. Humphreys. Electron Microscopy and Analysis. 3rd ed. London: Taylor & Francis, 2001.
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ציטוט MLA
Goodhew, Peter J., et al. Electron Microscopy and Analysis. 3rd ed. Taylor & Francis, 2001.
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אזהרה: ציטוטים אלה לעיתים לא מדויקים ב 100%.