Search Results - Wen, Xiaoqing

Xiaoqing Wen

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Xiaoqing Wen from the Kyushu Institute of Technology, Iizuka, Fukuoka, Japan was named Fellow of the Institute of Electrical and Electronics Engineers (IEEE) in 2012 ''for contributions to testing of integrated circuits''. Provided by Wikipedia
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    VLSI test principles and architectures design for testability /

    VLSI test principles and architectures design for testability /

    Published 2006
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    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook
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    VLSI test principles and architectures design for testability /

    VLSI test principles and architectures design for testability /

    Published 2006
    Other Authors:
    An electronic book accessible through the World Wide Web; click to view
    Electronic eBook
    Save to List
    Saved in:

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