Rezultati - Padilla, J. Moises

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    Slika na naslovnici

    Fringe pattern analysis for optical metrology : theory, algorithms, and applications / od Servín, Manuel, Quiroga, J. Antonio, Padilla, J. Moises

    Izdano 2014
    An electronic book accessible through the World Wide Web; click to view
    Elektronski eKnjiga

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