Torthaí cuardaigh - Padilla, J. Moises
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Fringe pattern analysis for optical metrology : theory, algorithms, and applications / de réir Servín, Manuel, Quiroga, J. Antonio, Padilla, J. Moises
Foilsithe / Cruthaithe 2014Gairmuimhir: Ag lódáil…An electronic book accessible through the World Wide Web; click to view
Suíomh: Ag lódáil…
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