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    Delwedd Flaen

    Fringe pattern analysis for optical metrology : theory, algorithms, and applications / gan Servín, Manuel, Quiroga, J. Antonio, Padilla, J. Moises

    Cyhoeddwyd 2014
    An electronic book accessible through the World Wide Web; click to view
    Electronig eLyfr

    Ychwanegu at ffefrynnau
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