Design for at-speed test, diagnosis, and measurement

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A designer's guide to built-in self-test por Stroud, Charles E.

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Boundary-scan interconnect diagnosis por Sousa, José T. de

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Microwave component mechanics por Eskelinen, Harri

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Telecosmos the next great telecom revolution / por Edwards, John

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Electronic materials science por Irene, Eugene A.

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Parts selection and management

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Knowledge-based intelligent information engineering systems and allied technologies KES 2002 /

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EMC for product designers por Williams, Tim, 1954-

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Hertzian tales electronic products, aesthetic experience, and critical design / por Dunne, Anthony

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High tech trash digital devices, hidden toxics, and human health / por Grossman, Elizabeth, 1957-

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Power sources and supplies world class designs /

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Polymers for electronic components a Rapra industry analysis report / por Cousins, Keith

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ESD circuits and devices / por Voldman, Steven H.

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ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /

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ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /

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ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

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ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

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Microelectronic failure analysis desk reference : 2001 supplement /

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ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

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