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  1. 1
    Design for at-speed test, diagnosis, and measurement

    Design for at-speed test, diagnosis, and measurement

    Veröffentlicht 2000
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  2. 2
    A designer's guide to built-in self-test

    A designer's guide to built-in self-test von Stroud, Charles E.

    Veröffentlicht 2002
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  3. 3
    Boundary-scan interconnect diagnosis

    Boundary-scan interconnect diagnosis von Sousa, José T. de

    Veröffentlicht 2001
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  4. 4
    Microwave component mechanics

    Microwave component mechanics von Eskelinen, Harri

    Veröffentlicht 2003
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  5. 5
    Telecosmos the next great telecom revolution /

    Telecosmos the next great telecom revolution / von Edwards, John

    Veröffentlicht 2005
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  6. 6
    Electronic materials science

    Electronic materials science von Irene, Eugene A.

    Veröffentlicht 2005
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  7. 7
    Parts selection and management

    Parts selection and management

    Veröffentlicht 2004
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  8. 8
    Knowledge-based intelligent information engineering systems and allied technologies KES 2002 /

    Knowledge-based intelligent information engineering systems and allied technologies KES 2002 /

    Veröffentlicht 2002
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  9. 9
    EMC for product designers

    EMC for product designers von Williams, Tim, 1954-

    Veröffentlicht 2007
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  10. 10
    Hertzian tales electronic products, aesthetic experience, and critical design /

    Hertzian tales electronic products, aesthetic experience, and critical design / von Dunne, Anthony

    Veröffentlicht 2005
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  11. 11
    High tech trash digital devices, hidden toxics, and human health /

    High tech trash digital devices, hidden toxics, and human health / von Grossman, Elizabeth, 1957-

    Veröffentlicht 2006
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  12. 12
    Power sources and supplies world class designs /

    Power sources and supplies world class designs /

    Veröffentlicht 2008
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  13. 13
    Polymers for electronic components a Rapra industry analysis report /

    Polymers for electronic components a Rapra industry analysis report / von Cousins, Keith

    Veröffentlicht 2001
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  14. 14
    ESD circuits and devices /

    ESD circuits and devices / von Voldman, Steven H.

    Veröffentlicht 2006
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  15. 15
    ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /

    ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /

    Veröffentlicht 2008
    An electronic book accessible through the World Wide Web; click to view
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  16. 16
    ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /

    ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /

    Veröffentlicht 2002
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  17. 17
    ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

    ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

    Veröffentlicht 2007
    An electronic book accessible through the World Wide Web; click to view
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  18. 18
    ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

    ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

    Veröffentlicht 2000
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  19. 19
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Veröffentlicht 2001
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  20. 20
    ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

    ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

    Veröffentlicht 2001
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