प्रस्तावित विषय : खोज निहित
प्रस्तावित विषय : खोज निहित
- Electronics
- Materials 21
- Electronic apparatus and appliances 20
- Testing 20
- Optoelectronics 2
- Technological innovations 2
- Electrical engineering 1
- Light emitting diodes 1
- Mechanical engineering 1
- Metal oxide semiconductors, Complementary 1
- Metamaterials 1
- Nanoelectromechanical systems 1
- Oxides 1
- Semiconductors 1
- Superconductors 1
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ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /
प्रकाशित 2008An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
2
ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /
प्रकाशित 2002An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
3
ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /
प्रकाशित 2007An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /
प्रकाशित 2001An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.
प्रकाशित 1999An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /
प्रकाशित 1998An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
10
ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.
प्रकाशित 1996An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /
प्रकाशित 2004An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.
प्रकाशित 2006An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, Califo...
प्रकाशित 2009An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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Mechanical and Electronics Engineering proceedings of the International Conference on ICMEE 2009, Chennai, India, 24-26 July 2009 /
प्रकाशित 2010An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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Frontiers in electronics
प्रकाशित 2009An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /
प्रकाशित 2010An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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ISTFA 2011 conference proceedings of the 37th International Symposium for Testing and Failure Analysis : November 13-17, 2011, San Jose Convention Center, San Jose, California, USA...
प्रकाशित 2011An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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ISTFA 2012 conference proceedings from the 38th International Symposium for Testing and Failure Analysis : November 11-15, 2012, Phoenix Convention Center, Phoenix, Arizona, USA.
प्रकाशित 2012An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक -
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Frontiers in electronics proceedings of the Workshop on Frontiers in Electronics 2009(WOFE) /
प्रकाशित 2009An electronic book accessible through the World Wide Web; click to view
इलेक्ट्रोनिक सम्मेलन की कार्यवाही ई-पुस्तक
