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  1. 61
    ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

    ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

    Izdano 2007
    An electronic book accessible through the World Wide Web; click to view
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  2. 62
    ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

    ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

    Izdano 2000
    An electronic book accessible through the World Wide Web; click to view
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  3. 63
    Microelectronic failure analysis desk reference : 2001 supplement /

    Microelectronic failure analysis desk reference : 2001 supplement /

    Izdano 2001
    An electronic book accessible through the World Wide Web; click to view
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  4. 64
    ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

    ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

    Izdano 2001
    An electronic book accessible through the World Wide Web; click to view
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  5. 65
    ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.

    ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.

    Izdano 1999
    An electronic book accessible through the World Wide Web; click to view
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  6. 66
    ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

    ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

    Izdano 2005
    An electronic book accessible through the World Wide Web; click to view
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  7. 67
    ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /

    ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /

    Izdano 1997
    An electronic book accessible through the World Wide Web; click to view
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  8. 68
    ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /

    ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /

    Izdano 1998
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  9. 69
    ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

    ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

    Izdano 1996
    An electronic book accessible through the World Wide Web; click to view
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  10. 70
    ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /

    ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /

    Izdano 2004
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  11. 71
    ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.

    ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.

    Izdano 2006
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  12. 72
    ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /

    ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /

    Izdano 2003
    An electronic book accessible through the World Wide Web; click to view
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  13. 73
    Microelectronic failure analysis desk reference.

    Microelectronic failure analysis desk reference.

    Izdano 2002
    An electronic book accessible through the World Wide Web; click to view
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  14. 74
    Electrical characterization of organic electronic materials and devices

    Electrical characterization of organic electronic materials and devices od Stallinga, Peter, 1966-

    Izdano 2009
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  15. 75
    Radiating non-uniform transmission line systems and the partial element equivalent circuit method

    Radiating non-uniform transmission line systems and the partial element equivalent circuit method od Nitsch, Jürgen

    Izdano 2009
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  16. 76
    Electronic components and processes

    Electronic components and processes od Maheshwari, Preeti

    Izdano 2006
    An electronic book accessible through the World Wide Web; click to view
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  17. 77
    ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, California, USA /

    ISTFA 2009 conference proceedings from the 35th International Symposium for Testing and Failure Analysis, November 14-19, 2009, San Jose McEnery Convention Center, San Jose, Califo...

    Izdano 2009
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  18. 78
    Introduction to microfabrication

    Introduction to microfabrication od Franssila, Sami

    Izdano 2010
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  19. 79
    Single-electron devices and circuits in silicon

    Single-electron devices and circuits in silicon od Durrani, Zahid Ali Khan

    Izdano 2010
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  20. 80
    ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /

    ISTFA 2010 conference proceedings from the 36th International Symposium for Testing and Failure Analysis, November 14-18, 2010, InterContinental Hotel Dallas, Dallas, Texas, USA /

    Izdano 2010
    An electronic book accessible through the World Wide Web; click to view
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