Materials research to meet 21st century defense needs

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Electric refractory materials

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Materials research to meet 21st century defense needs interim report /

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Electronic materials science Por Irene, Eugene A.

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ISTFA 2008 conference proceedings from the 34th International Symposium for Testing and Failure Analysis, November 2-6, 2008, Oregon Convention Center, Portland, Oregon, USA /

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ISTFA 2002 proceedings of the 28th International Symposium for Testing and Failure Analysis : 3-7 November 2002, Phoenix Civic Center, Phoenix, Ariz. /

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ISTFA 2007 proceedings of the 33rd International Symposium for Testing and Failure Analysis, November 4-8, 2007, San Jose McEnery Convention Center, San Jose, California, USA /

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ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

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Microelectronic failure analysis desk reference : 2001 supplement /

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ISTFA 2001 proceedings of the 27th International Symposium for Testing and Failure Analysis : 11-15 November 2001, Santa Clara Convention Center, Santa Clara, California /

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ISTFA '99 proceedings of the 25th International Symposium for Testing and Failure Analysis : 14-18 November 1999, Westin Hotel, Santa Clara, California.

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ISTFA 2005 Proceedings of the 31st International Symposium for Testing and Failure Analysis, Movember 6-10, 2005, McEnery Convention Center, San Jose, California /

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ISTFA '97 proceedings of the 23rd International Symposium for Testing and Failure Analysis : 27-31 October, 1997, Santa Clara Convention center, Santa Clara, California /

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ISTFA '98 proceedings of the 24th International Symposium for Testing and Failure Analysis : 15-19 November 1998, Hyatt Regency DFW, Dallas, Texas /

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ISTFA '96 proceedings of the 22nd International Symposium for Testing and Failure Analysis : 18-22 November 1996, Los Angeles, California.

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ISTFA 2004 proceedings of the 30th International Symposium for Testing and Failure Analysis, November 14-18, 2004, Worcester's Centrum Centre, Worcester (Boston), Massachusetts /

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ISTFA 2006 proceedings of the 32nd International Symposium for Testing and Failure Analysis, November 12-16, 2006, Renaissance Austin Hotel, Austin, Texas, USA.

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ISTFA 2003 proceedings of the 29th International Symposium for Testing and Failure Analysis, 2-6 November 2003, Santa Clara Convention Center, Santa Clara, California /

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Microelectronic failure analysis desk reference.

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Polymer electronics a flexible technology /

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