ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Afficher d'autres versions (1)
Enregistré dans:
Détails bibliographiques
Collectivités auteurs: International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Électronique Actes de congrès eBook
Langue:English
Publié: Materials Park, OH : ASM International, c2000.
Sujets:
Electronics > Materials > Testing > Congresses.
Electronic apparatus and appliances > Testing > Congresses.
Electronic books.
Accès en ligne:An electronic book accessible through the World Wide Web; click to view
Tags: Ajouter un tag
Pas de tags, Soyez le premier à ajouter un tag!

Internet

An electronic book accessible through the World Wide Web; click to view

Documents similaires