ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Gorde:
Xehetasun bibliografikoak
Egile korporatiboa: International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Formatua: Baliabide elektronikoa Conference Proceeding eBook
Hizkuntza:English
Argitaratua: Materials Park, OH : ASM International, c2000.
Gaiak:
Sarrera elektronikoa:An electronic book accessible through the World Wide Web; click to view
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