ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.

Saved in:
Bibliographic Details
Corporate Authors: International Symposium for Testing and Failure Analysis Bellevue, Wash., ASM International, Electronic Device Failure Analysis Society, ebrary, Inc
Format: Electronic Conference Proceeding eBook
Language:English
Published: Materials Park, OH : ASM International, c2000.
Subjects:
Online Access:An electronic book accessible through the World Wide Web; click to view
Tags: Add Tag
No Tags, Be the first to tag this record!

Similar Items