ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.
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| Corporate Authors: | , , , |
|---|---|
| Format: | Electronic Conference Proceeding eBook |
| Language: | English |
| Published: |
Materials Park, OH :
ASM International,
c2000.
|
| Subjects: | |
| Online Access: | An electronic book accessible through the World Wide Web; click to view |
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| 035 | |a (OCoLC)647829189 | ||
| 040 | |a CaPaEBR |c CaPaEBR | ||
| 050 | 1 | 4 | |a TA409 |b .I577 2000eb |
| 111 | 2 | |a International Symposium for Testing and Failure Analysis |n (26th : |d 2000 : |c Bellevue, Wash.) | |
| 245 | 1 | 0 | |a ISTFA 2000 |h [electronic resource] : |b proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington. |
| 246 | 3 | 0 | |a Proceedings of the 26th International Symposium or Testing and Failure Analysis |
| 246 | 3 | |a Conference Proceedings from the 26th International Symposium for Testing and Failure Analysis | |
| 260 | |a Materials Park, OH : |b ASM International, |c c2000. | ||
| 300 | |a xvi, 577 p. : |b ill. | ||
| 500 | |a "Sponsored by EDFAS, ISTFA". | ||
| 504 | |a Includes bibliographical references and index. | ||
| 533 | |a Electronic reproduction. |b Palo Alto, Calif. : |c ebrary, |d 2009. |n Available via World Wide Web. |n Access may be limited to ebrary affiliated libraries. | ||
| 650 | 0 | |a Electronics |x Materials |x Testing |v Congresses. | |
| 650 | 0 | |a Electronic apparatus and appliances |x Testing |v Congresses. | |
| 655 | 7 | |a Electronic books. |2 local | |
| 710 | 2 | |a ASM International. | |
| 710 | 2 | |a Electronic Device Failure Analysis Society. | |
| 710 | 2 | |a ebrary, Inc. | |
| 856 | 4 | 0 | |u http://site.ebrary.com/lib/daystar/Doc?id=10320364 |z An electronic book accessible through the World Wide Web; click to view |
| 908 | |a 170314 | ||
| 942 | 0 | 0 | |c EB |
| 999 | |c 101494 |d 101494 | ||
ISTFA 2000 proceedings of the 26th International Symposium for Testing and Failure Analysis, 12-16 November 2000, Meydenbauer Convention Center, Bellevue, Washington.